SN74BCT8373ANT - IC SCAN TEST DEVICE LATCH 24-DIP

Tootja arv
Sisemine osa number
Lühikirjeldus
IC SCAN TEST DEVICE LATCH 24-DIP
RoHS-staatus
Pliivaba / RoHS Vastavuses
Tarne aeg
1-2 päeva
saadaval Kogus
16000 Pieces
Viide Hind
USD 0
Meie hind
- (Palun võtke meiega parem hind: [email protected])

AX Semiconductor on SN74BCT8373ANT laos müüa.
Saatmine võimalusi ja tarneaeg:
DHL: 2-3 days.
FEDEX: 2-3 days.
UPS: 2-4 days.
TNT: 3-5 days.
EMS: 5-8 days.
Normal Post: 10-15 days.
Maksevõimalused:
Paypal (Credit Card)
Bank Transfer (Wire Transfer)
Western Union
MoneyGram

spetsifikatsioonid SN74BCT8373ANT

kvaliteedi tagamise : 365 päeva garantii
stock Resource : Frantsiisi Edasimüüja / Tootja Direct
Päritoluriik : USA / TAIWAN / MEXICO / MALAYSIA / PHI
Osa number : SN74BCT8373ANT
tootja : Texas Instruments
kirjeldus : IC SCAN TEST DEVICE LATCH 24-DIP
seeria : 74BCT
Osa olek : Obsolete
Loogika tüüp : Scan Test Device with D-Type Latches
Toitepinge : 4.5V ~ 5.5V
Bittide arv : 8
Töötemperatuur : 0°C ~ 70°C
Paigaldus tüüp : Through Hole
Pakett / kohver : 24-DIP (0.300", 7.62mm)
Tarnija seadme pakett : 24-PDIP
kaal : -
tingimus : Uus ja originaal
seotud lingid : SN74 , SN74BCT

dokumendid SN74BCT8373ANT

andmelehe : SN74BCT8373ANT.pdf

Seotud tooted SN74BCT8373ANT Texas Instruments

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