SN74ABT8543DW - IC SCAN TEST DEV/TXRX 28-SOIC
Tootja arv
Sisemine osa number
tootja
Lühikirjeldus
IC SCAN TEST DEV/TXRX 28-SOIC
RoHS-staatus
Pliivaba / RoHS Vastavuses
Tarne aeg
1-2 päeva
saadaval Kogus
48774 Pieces
Viide Hind
Meie hind
- (Palun võtke meiega parem hind: [email protected])
- AX Semiconductor on SN74ABT8543DW laos müüa.
- Saatmine võimalusi ja tarneaeg:
- DHL: 2-3 days.
- FEDEX: 2-3 days.
- UPS: 2-4 days.
- TNT: 3-5 days.
- EMS: 5-8 days.
- Normal Post: 10-15 days.
- Maksevõimalused:
- Paypal (Credit Card)
- Bank Transfer (Wire Transfer)
- Western Union
- MoneyGram
spetsifikatsioonid SN74ABT8543DW
kvaliteedi tagamise :
365 päeva garantii
stock Resource :
Frantsiisi Edasimüüja / Tootja Direct
Päritoluriik :
USA / TAIWAN / MEXICO / MALAYSIA / PHI
Osa number :
SN74ABT8543DW
tootja :
Texas Instruments
kirjeldus :
IC SCAN TEST DEV/TXRX 28-SOIC
seeria :
74ABT
Osa olek :
Active
Loogika tüüp :
Scan Test Device with Registered Bus Transceiver
Toitepinge :
4.5V ~ 5.5V
Bittide arv :
8
Töötemperatuur :
-40°C ~ 85°C
Paigaldus tüüp :
Surface Mount
Pakett / kohver :
28-SOIC (0.295", 7.50mm Width)
Tarnija seadme pakett :
28-SOIC
kaal :
-
tingimus :
Uus ja originaal
dokumendid SN74ABT8543DW
andmelehe :
SN74ABT8543DW.pdf
Seotud tooted SN74ABT8543DW Texas Instruments
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|---|---|---|---|
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CAP CER 4000PF 20KV SCREW. |
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CAP CER 75PF 30KV AXIAL. |
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AVX Corporation |
CAP CER 0.022UF 50V X7R 1206. |
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Vishay Beyschlag |
CAP CER 100PF 30KV AXIAL. |
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Vishay Beyschlag |
CAP CER 5000PF 12KV SCREW. |
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Vishay Beyschlag |
CAP CER 10000PF 13KV R230 DISK. |
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Vishay Beyschlag |
CAP CER 1000PF 14KV SCREW. |
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Vishay Beyschlag |
CAP CER 5000PF 16KV SCREW. |